Simulated CBED pattern  TEMStrain Simulated CBED pattern



TEMStrain is a package for determination of strain  with respect to a reference crystal lattice based on convergent beam electron diffraction (CBED) patterns.  By computing a complete strain tensor, it provides the actual lattice parameters. Therefore, it can be seen as a tool for refinement of lattice parameters. Moreover, the package has the capability of refining microscope voltage and camera length.

The calculations are based on matching experimental and simulated diffraction patterns. In the process the simulated patterns are calculated numerous times. Taking into account long computation times needed for dynamic simulations, the matching relies mainly on kinematic simulations. The package allows for dynamic simulation of CBED patterns but this is an auxiliary feature. 

TEMStrain combines capabilities of a number of earlier programs, from an easy adjustment of orientations, through a straightforward detection and indexing of HOLZ lines, to a direct accessibility of dynamically simulated patterns. However, the most important feature of this software is that the reliability of results can be verified by comparing the output from a number of different strategies available in the package.

TEMStrain v.1.3,   Dec. 2014

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