During October :
- I was investigating the spin coated Si wafer by SEM obserwations and optical measurements. Observed improvement of reflection reduction vanishes after washing the sample. Only few silver NPs were found by SEM observations. This work undermines previously obtained results and NPs-caused cell enhancement. Most probable explanation of cell improovement is formation of quasi antireflection coating from other solution compounds.
- I attended in general AFM and FTIR instruction.
- I performed SEM observations of photochemically prepared samples. Most important fingig was diveristy of particles shape with the beam intensity changes across one sample .