In November I took part in the European PhD School on "Nanoanalysis using focussed ion and electron beams" - Week 1: "Secondary Ion Mass Spectrometry (SIMS), Transmission Electron Microscopy (TEM), Auger Electron Spectroscopy (AES): a comprehensive overview" held in Centre de Recherche Public - Gabriel Lippmann (Belvaux, Luxembourg, November 14-18)
The workshop gave me an overview of the three nanometric analytical techniques - Secondary Ion Mass Spectrometry, Auger Electron Spectroscopy and Transmission Electron Microscopy. Lectures covered: ion and electron interactions with matter, instrumentation and application aspects of these techniques.
Apart from the lectures, I also participated in 5 practical sessions (which took place directly in front of the instruments) - each one devoted to the one of the following techniques: Dynamic SIMS, NanoSIMS, AES or Tof-SIMS.