I attended in ‘Advanced Electron Microscopy Methods Applied to Investigations of Nanomaterials’ in 6-7.10.2011 r., organized by Warsaw University of Technology and Hitachi High-Technologies. During first day I precipitated in lectures:

- ‘Advanced sample preparation technique with the NB5000 for reactive materials’ given by M. Konno;
- ‘Characterization of oxide nanoparticles in ODS ferritic steel’ given by Prof. M. Lewandowska;
- ‘Applying of Cs corrected TEM for structure identification’ given by Prof. P. Dłużewski;
- ‘New instrumentation for high resolution EM’ given by dr. M. Haider;
- ‘First experiences with the HD-2700 at ETH Zurich: an overview from material to life science applications’ given by dr. E. Muller and dr. R. A. Haider;
- ‘Atomic resolution secondary electron imaging with Hitachi HD-2700 aberration corrected STEM’ given by H. Inada;
- ‘Nanoscale imaging via SEM and STEM – background and case studies’ given by dr. T. Płociński;
- ‘Applications of STEM detectors in Scanning Electron Microscopy in materials science’ given by dr. T. Tokarski.
After lectures were provided lab tour.

On second day there were carried workshops – I attended in EBSD research with use SEM Hitachi SU-70.