Modified matching program schedule features the experimental X-ray peaks. It was found that different types of distributions, by their different nature, can result in a variable position of the peak, which is a key parameter for us. Therefore, the decision was made to one type of decomposition - Pearson distribution in three different variations of parameter power series. If the need arises also will adjust the program doubled peak (peak Kbeta part). This was followed by the traditional method of measuring stress traditional sin ² Ψ at Phi = 0 and 90, and Psi from zero to 75 at 7.5 and assigned to each designated decay fit certain weight to the data and prepared charts sin ² Ψ by taking into account the importance of each point.
Then we written a function that takes arguments crystallographic lattice parameters - default for Mg, h, k, l plane, phi, chi goniometer, i, j, k, l, tensor - the coordinates of the elastic susceptibility tensor element and the same tensor. This function prints a list: the Eulerization angles, rotation matrix around the diffraction vector of iterated angle sensor, ijkl-th element of rotated tensor. Using this feature allows you to write to the plane crystallographic data fi Chi and all the necessary components 33ij of rotated tensor with Euler angles. On the basis of these data and the values of the orientation distribution function was calculated diffraction elastic constants, weighing just rotated tensor orientation distribution function.