I decided to find a way for finding maxima in the
5-paremter grain boundary distribution function.
From the computational point of view, it is
a very complex (and time-consuming) task.
With reduction of the investigated
domain to the fundamental zone, it can be done quite efficiently,
but the question arises if some information is missing.
At least we lose, the information about multiplicities of boundaries,
however, still most of the maxima should be found.

The most interesting things from this month:

-during research stay in Budapest I had opportunity to perform in-situ heating of the melt spun ribbons in TEM
- I have received positive review of my article
- I have carried out microhardness measurements of melt spun ribbons
- in order to prepare compact samples I have pulverized firs series of melt spun ribbons using vibration micro mill
- I have participated in the Joint PhD Seminar at the AGH University

In the beginning of this month presented a seminar in the Institute of Metallurgy and Materials Science PAS. The seminar was connected with the beginning of the PhD procedure and it was entitled: “Application of three-dimensional orientation microscopy to microstructure characterization”. The supervisor of the work is Prof. dr hab. inż. Marek Faryna and the assistant supervisor is dr inż. Anna Sypień.

This month, I attended in a seminar called "2nd Joint PhD Seminar" held in Krakow in 17-18 October 2013. That was the second meeting of PhD students from PAS and TU Dresden (Germany) and this year also joined the semminar PhD students of AGH.

I gave a presentation: " Morphological and textural changes during annealing of fine grained AA1050 aluminum alloy ."

Summary of my presentation was published in the conference proceedings:

Abstract
The main aim of the experiment was to analyze the microstructure and texture changes during recrystallization of commercial AA1050 aluminium alloy. The samples were processed by equal channel angular pressing (ECAP) along route A up to six passes and then annealed for 1 hour at selected temperatures (ranging from 100°C to 350°C) to obtain different states of recrystallization. Studies carried out using scanning electron microscopy equipped with high-resolution electron backscattered diffraction facility (EBSD). An additional analysis was made by means of X-ray diffractometer.
The obtained results showed that at lower annealing temperatures, the material retains ultra-fine grain structure formed by ECAP.
At higher annealing temperatures rapid grain growth appears and transformation of flattened grains into nearly equiaxed ones was observed. Particular role in the rise of nuclei (at early stages of recrystallization) was attributed to migration of low-angle boundaries and cells coalescence. Later recrystallization stages were attributed to high-angle grain boundaries migration. These processes led to nearly equiaxed grains. It was documented that the length of traces of low- and high- angle boundaries decrease with increasing temperature of annealing. For lower annealing temperatures, the average values of misorientation angle across both types of grain boundaries increases. However, above the temperature of 270°C the value of misorientation angle across the low-angle boundaries decreases. The {111} pole figures showed in the deformed and partially recrystallized states two, nearly complementarily oriented texture components. At the temperature of 270°C these texture components were changed into other two dominant (also complementarily or twin-related) ones.

I examined waviness of silicon wafers using contact profilometer. It turned out that as a result they have cut quite high inhomogeneity in thickness reaching even 8 microns. Above all, I had a presentation with all obtained results and I was able to register for Ph.D. title conferment procedure.