In January I have participated in SEM training course that have been organized in our Institute for interested young scientists and PhD students. During the training we used Institute Philips Electron Optics XL30 Scanning Electron Microscope equipped with LINK ISIS Energy Dispersive Spectrometer from Oxford Instrument. Training consisted of five meetings each lasting between two to four hours. During its course we have learned basic techniques required for sample observations in secondary and backscattered electrons. Additional training was given for X-ray chemical microanalysis for both standard-less and standard quantitative analysis, as well as chemical mapping.
Apart from training I have conducted mechanical tests on grade 2 and grade 4 titanium before (tensile tests + hardness) and after (hardness) KoBo extrusion.
Additionally first samples of titanium treated by electroerosion cutting have been prepared and inspected by means of scanning electron microscope.

Main studies carried out during the month:

- investigation of melt spun ribbons with hafnium addition (including microhardness measurements and microstructure analysis using SEM and TEM)
- investigation of melt spun ribbons with tungsten addition (TEM)
- preparation of an article for the AMT conference
- some trials on application of thermomechanical analysis to ribbons investigations (to determine linear thermal expansion coefficient of melt spun ribbons and their young modulus depending on temperature)

This month I was preparing to the exam of French and I made some literature review (continued study).

Last month I’ve made a second attempt towards in situ formation of AlN reinforcement in aluminium matrix. The experiment involved melting of aluminium in Balzers type induction furnace, and then, after removal of surface oxide layer, introduction of nitrogen-bearing substrate (in form of a green compact) to the metallic melt. Unfortunately, apart from eddy currents, there was no possibility of mixing the melt, which was the reason why the substrates remained on the surface of aluminium. As a result, aluminium nitride was found only in the surface layer of the material.

This month I changed the way I use FIB. Instead of running 3D-EBSD measurements I was focused on learning how to prepare a sample for TEM. This knowledge may be useful in the future because it may be necessary in T-EBSD measurements. They are based on detection of diffracted electrons that were transmitted through a thin sample. Such experiments are carried out in SEM. They may improve special resolution of the EBSD technique.