At the beginning of this month I went to an RMS meeting in Duesseldorf. It was about electron backscatter diffraction (EBSD). I have learned a few interesting things and found some new ideas during that conference. After coming back I faced problems the FEG in the microscope ending its life. The time when the FEG was off was spend on reading literature about new things I learned in Duesseldorf. Luckily the source was replaced for a new one in the middle of April and I could go back to work. I have been trying to do some measurements of a sample made of Al6013 after intense deformation. Additionally, I was practicing polishing samples surface with FIB. It enables to get smoother surface with better diffraction quality comparing to mechanical polishing. However, it consumes a lot of time. Unfortunately, I was not able to accomplish measurements because it turned out that the stage movement precision is poor. Probably some mechanical parts are worn out and have to be replaced. It is still possible to do regular things, but for the 3D EBSD the sample must always go back to exactly the same place when it is moving between milling and data collection positions during measurement.