In September I attended th XXIIth Conference on Applied Arystallography which took place between the 2nd-6th this month in Targanice in Silesia region. Few talks I found interesting although there weren't too many on shape memory materials. In fact there was only one concerning the mechanics of twin boundary motion in Ni-Mn-Ga alloys. In September also I busied myslef with milling. The ribbons obtained by melt spinning technique from induction cast alloys were subjected to the following milling times 1, 3, 5 hours. A sampel was taken after each milling time for XRD analysis. I managed also to get the powders milled the longest analysed in terms of voulme fraction distribution.

During the month I was studying samples of alloys with five components (namely with Zr and Mo addition) using TEM. I took part in the conference „9-th Polish-Japanese Joint Seminar on Micro and Nano Analysis” where I gave presentation titled: „Effect of alloying elements on microstructure and properties of Al-Mn-Fe alloy". In September I also participated in the Polish conference for young scientists studying in the field of Materials Science called “School in Materials Science”. I gave short presentation during one of the session dedicated to non-ferrous alloys.

In this month I was mainly studying samples with Zr addition using TEM. I also performed some microhardness measurements. In the second part of the month I was preparing for the conference „9-th Polish-Japanese Joint Seminar on Micro and Nano Analysis” (abstract, presentation).

Samples of AA3004 aluminium alloy pre-deformed by ECAP and annealed at 265°C and 280°C have been prepared to the observations in scanning electron microscope (EBSD/SEM).
I tried to calculate the percentages of the various components of texture of faded 20-degree for each of samples of AA1050 aluminium alloy- in the initial state, deformed in ECAP die and rekrystalized (partially).
Texture components were defined as:
- C = {112} <111> - „Copper”;
- S = {123} <634> - „S”;
- G = {110} <001> - „Goss”;
- B = {110} <112> - „Brass”.
The measurements were done in cross-section ND-TD and TD-ND but I wanted to transform data into rolling (plane ED-TD).Issue has been difficult.

AFM studies show that the highest roughness is obtained fo a silicon wafer textured in acid solution contains 8HF:1HNO3:1H2O. Process time was 1 minute - this is a relatively short period of time leading to a significant reduction in production costs. AFM investigations are consistent with reflection measurements - the higher roughness the higher reflection decrease.