How
to proceed in order to determine strain tensor from multiple patterns?
Strain determination from one CBED pattern is troubled by an ambiguity problem. For the determination of the complete strain tensor (complete set of lattice parameters), it is recomended to use at least three diffraction patterns originating from the same point of the sample. Assuming that a set of patterns in (proper digital format) is given, use the interface in the following way:
When saved, projects are written in .tspr files. These files should be kept in the same directory as all .bmp files containing patterns of the project. Also results of dynamic simulation will be automatically saved in the same directory. If this directory is changed, the path specified in the .tspr file must be corrected.
It must stressed again that the optimization problem solved in determination of all lattice parameters from a single pattern is ill-conditioned (ambiguity problem), and even if more patterns are used, the results may be erroneous. Moreover, the calculations are influenced by distortions present in experimental patterns. No matter how many patterns are used, one needs to be accurate with input data and very scrupulous in marking the HOLZ lines. Results need to be confirmed by applying a number of computational approaches (with various combinations of patterns, diverse sets of marking lines, changing starting and bounding values of parameters et cetera) and by visual inspection. Even if the resulting parameters lead to apparently perfect fit between the experimental and simulated patterns, one should remain sceptical and double-check each detail.TEMStrain v.1.3, Dec. 2014